Aboltins, A.; Migla, S.; Tihomorskis, N.; Ratners, J.; Barkans, R.; Kurtenoks, V. High-Speed Signal Digitizer Based on Reference Waveform Crossings and Time-to-Digital Conversion. Electronics 2026, 15, 153. https://doi.org/10.3390/electronics15010153
Event-driven ADC using multiple thresholds.
MSO captured output waveforms: (a) test waveform (blue), sampling waveform (red), and (b) level detector rising (green) and falling (purple) edge.
Table. Damped sine test signal sampled by triangle and sawtooth sampling signals at different frequencies f. The first 200 time tags from both rising and falling edges are visualized.
Supplementary files are available at the Article’s page.
